New APIC method eliminates blurriness and distortion in microscopy
"We arrive at a solution of the high-resolution complex field in a closed-form fashion, as we now have a deeper understanding in what a microscope captures, what we already know, and what we need to truly figure out, so we don't need any iteration," says Ruizhi Cao (PhD '24), co-lead author on the paper, a former graduate student in Yang's lab, and now a postdoctoral scholar at UC Berkeley.